M- Series

Manual measuring instrument suitable for development department and acceptance inspection

This is a jig for manual frequency measurement. A wide variety of target workpieces are available, from crystal blanks to wafers. When used together with the NET-3000 measurement system, data processing can be performed on a PC.

Basic Specifications

Model M-QB-300
(For crystal blanks)
M-QW-320
(For crystal wafers)
Available sizes

1.0mm × 0.5mm~2.0mm × 8.0mm

Max. φ100mm (4 inches)

Positioning method

Bushing type
(A special bush that matches the workpiece size is required.)

Measurement item

・Blank fundamental frequency
・Blank Spurious Frequency (SF)
・CI

・Wafer fundamental frequency
・Wafer spurious frequency (SF)
・CI

Measurement frequency

10~300MHz

10~60MHz

Measurement system

NET-3000 network analyzer R3755A(ADVANTEST)

Measurement point

One point in the center

Many points

Measurement accuracy

100ppm(Repeat 10 times for the same blank)

100ppm(Same wafer repeated 10 times)

Move stroke

fixed

X-axis direction = Maximum ±55mm from the center position
Y-axis direction = Maximum ±55mm from the center position
(Moving stroke minimum unit: 0.01mm)

Dimensions

200(W) × 250(D) × 300(H)mm

420(W) × 720(D) × 480(H)mm

Input power supply

AA batteries 2 pcs.

Flow of introduction