A-QW-3700Series

Multi-point measurement system for round and square wafers up to 4 inches in size

Frequency sorting of round and square quartz wafers. The wafer measurement point can be programmed.

Model 3720
(For square wafers only)
3750
(For round wafers only)
Available sizes

2~3 inches

2~4 inches

Measurement item

・Wafer fundamental frequency
・Wafer multipoint frequency (Max, Nin , Ave)
・CI

Measurement frequency

10 to 60MHz

Measuring instrument

Network analyzer R3755A(ADVANTEST)

Measurement accuracy

100ppm (repeating of the same wafer 10 times)

processing power

Average 10 seconds / measure(Including measurement time 140mS x 3 places)

Dimension

1400(W) × 1500(D) × 1800(H)mm

1870(W) × 885(D) × 1655(H)mm

Supply

8 pcs carrier

4 pcs carrier

Receipts

30 pcs carrier

10 pcs carrier

Classification

Number of classifications: 30 ranks (including RI)
OK1~OK24、+NG、-NG、CING
spurious NG、RPLNG、RI

Number of classifications: 10 ranks
OK1~OK8、+NG、-NG

Input power supply

Three-phase AC 200 V 50/60 Hz

AC200V 50/60Hz

Air Supply

0.4 MPa (dry clean air)

Flow of introduction